A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device

Ali Abboud; Christoph Kirchlechner; Sebastian Send; Jean Sébastien Micha; Olivier Ulrich; N. Pashniak; Lothar W J Strüder; Jozef Keckes; Ullrich Pietsch

doi:10.1063/1.4900482

A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device

Ali Abboud, Christoph Kirchlechner, Sebastian Send, Jean Sébastien Micha, Olivier Ulrich, N. Pashniak, Lothar W J Strüder, Jozef Keckes, Ullrich Pietsch

Chair of Materials Physics (430)

Research output: Contribution to journal › Article › Research › peer-review

8 Citations (Scopus)

Translated title of the contribution	A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device
Original language	English
Pages (from-to)	1139011-1139018
Journal	Review of scientific instruments
Volume	85
DOIs	https://doi.org/10.1063/1.4900482
Publication status	Published - 2014

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10.1063/1.4900482

Cite this

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title = "A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device",

author = "Ali Abboud and Christoph Kirchlechner and Sebastian Send and Micha, {Jean S{\'e}bastien} and Olivier Ulrich and N. Pashniak and Str{\"u}der, {Lothar W J} and Jozef Keckes and Ullrich Pietsch",

year = "2014",

doi = "10.1063/1.4900482",

language = "English",

volume = "85",

pages = "1139011--1139018",

journal = "Review of scientific instruments",

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T1 - A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device

AU - Abboud, Ali

AU - Kirchlechner, Christoph

AU - Send, Sebastian

AU - Micha, Jean Sébastien

AU - Ulrich, Olivier

AU - Pashniak, N.

AU - Strüder, Lothar W J

AU - Keckes, Jozef

AU - Pietsch, Ullrich

PY - 2014

Y1 - 2014

U2 - 10.1063/1.4900482

DO - 10.1063/1.4900482

M3 - Article

SN - 0034-6748

VL - 85

SP - 1139011

EP - 1139018

JO - Review of scientific instruments

JF - Review of scientific instruments

ER -