A cantilever method to determine depth profiles of residual stresses on the nanoscale

Stefan Massl, Jozef Keckes, Reinhard Pippan

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionA cantilever method to determine depth profiles of residual stresses on the nanoscale
Original languageEnglish
Publication statusPublished - 2006
EventGordon Research Conference on thin film & small scale mechanical behavior - Waterville, United States
Duration: 30 Jul 20064 Aug 2006

Conference

ConferenceGordon Research Conference on thin film & small scale mechanical behavior
Country/TerritoryUnited States
CityWaterville
Period30/07/064/08/06

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