Recent advances in applying in-situ electron microscopy for local determination of crack processes
- Kiener, D. (Speaker)
- Alfreider, M. (contributor)
- Inas Issa (contributor)
- Michael Wurmshuber (contributor)
- Burtscher, M. (contributor)
- Klemens Silvester Schmuck (contributor)
Activity: Talk or presentation › Invited talk