Evolution of microstructure and mechanical properties of graded TiAlON thin films investigated by cross-sectional characterization techniques
- Schalk, N. (Speaker)
- Tkadletz, M. (contributor)
- Terziyska, V. (contributor)
- Marco Deluca (contributor)
- Holec, D. (contributor)
- Keckes, J. (contributor)
- Mitterer, C. (contributor)
Activity: Talk or presentation › Invited talk