Atomic force microscopy based electrical characterization of multiphase intermetallic TiAl alloys
- Kratzer, M. (Speaker)
- Huszar, M. (contributor)
- Lisa Maria Tengg (contributor)
- Clemens, H. (contributor)
- Svea Mayer (Speaker)
- Teichert, C. (contributor)
Activity: Talk or presentation › Oral presentation