Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%

Lukas Kormos; Markus Kratzer; Konrad Kostecki; Michael Oehme; Tomas Sikola; Erich Kasper; Jörg Schulze; Christian Teichert

Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%

Lukas Kormos, Markus Kratzer, Konrad Kostecki, Michael Oehme, Tomas Sikola, Erich Kasper, Jörg Schulze, Christian Teichert

Lehrstuhl für Physik (460)

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

12 Zitate (Scopus)

Originalsprache	Englisch
Fachzeitschrift	Surface and interface analysis
Publikationsstatus	Veröffentlicht - 1 Apr. 2017

Schlagwörter

GeSn alloy
phase separation
epitaxy

Dieses zitieren

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AU - Kormos, Lukas

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AU - Sikola, Tomas

AU - Kasper, Erich

AU - Schulze, Jörg

AU - Teichert, Christian

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