Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods

Titel in Übersetzung: Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods

Klaus-Jürgen Martinschitz, E. Eiper, Jozef Keckes

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2006
Veranstaltung	7th European Conference Residual Stresses ECRS7 - Berlin, Deutschland Dauer: 13 Sept. 2006 → 15 Sept. 2006

Konferenz	7th European Conference Residual Stresses ECRS7
Land/Gebiet	Deutschland
Ort	Berlin
Zeitraum	13/09/06 → 15/09/06

Dieses zitieren

@conference{cb2e5e0ceeda44bca7b3d8e2ba9c72ca,

title = "Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2 methods",

author = "Klaus-J{\"u}rgen Martinschitz and E. Eiper and Jozef Keckes",

year = "2006",

language = "English",

note = "7th European Conference Residual Stresses ECRS7 ; Conference date: 13-09-2006 Through 15-09-2006",

}