Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz

Titel in Übersetzung: Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz

Paloma Tejedor, Luis Vázquez, Laura Díez-Merino, Igor Beinik, Christian Teichert

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2008
Veranstaltung	Intel European Research and Innovation Conference - Leixlip, Irland Dauer: 10 Sept. 2008 → 12 Sept. 2008

Konferenz	Intel European Research and Innovation Conference
Land/Gebiet	Irland
Ort	Leixlip
Zeitraum	10/09/08 → 12/09/08

Dieses zitieren

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title = "Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz",

author = "Paloma Tejedor and Luis V{\'a}zquez and Laura D{\'i}ez-Merino and Igor Beinik and Christian Teichert",

year = "2008",

language = "English",

note = "Intel European Research and Innovation Conference ; Conference date: 10-09-2008 Through 12-09-2008",

}

TY - CONF

T1 - Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz

AU - Tejedor, Paloma

AU - Vázquez, Luis

AU - Díez-Merino, Laura

AU - Beinik, Igor

AU - Teichert, Christian

PY - 2008

Y1 - 2008

M3 - Poster

T2 - Intel European Research and Innovation Conference

Y2 - 10 September 2008 through 12 September 2008

ER -