Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Titel in Übersetzung: Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Ernst Eiper, Klaus Jürgen Martinschitz, Gerhard Dehm, Jozef Keckes

Publikation: Konferenzbeitrag › Poster › Forschung › Begutachtung

Titel in Übersetzung	Size effect in metallic thin films characterized by low-temperature X-ray diffraction
Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2006
Veranstaltung	55th Annual Denver X-ray Conference - Denver, USA / Vereinigte Staaten Dauer: 7 Aug. 2006 → 11 Aug. 2006

Konferenz	55th Annual Denver X-ray Conference
Land/Gebiet	USA / Vereinigte Staaten
Ort	Denver
Zeitraum	7/08/06 → 11/08/06

Dieses zitieren

@conference{44982903b085460c804c4c43db421f5b,

title = "Size effect in metallic thin films characterized by low-temperature X-ray diffraction",

author = "Ernst Eiper and Martinschitz, {Klaus J{\"u}rgen} and Gerhard Dehm and Jozef Keckes",

year = "2006",

language = "English",

note = "55th Annual Denver X-ray Conference ; Conference date: 07-08-2006 Through 11-08-2006",

}