Rapid determination of stress factors and absolute residual stresses in thin films

K.J. Martinschitz; E. Eiper; S. Massl; Harald Köstenbauer; Rostislav Daniel; Gerardo Fontalvo; Christian Mitterer; Jozef Keckes

doi:10.1107/S002188980603322X

Rapid determination of stress factors and absolute residual stresses in thin films

Titel in Übersetzung: Rapid determination of stress factors and absolute residual stresses in thin films

K.J. Martinschitz, E. Eiper, S. Massl, Harald Köstenbauer, Rostislav Daniel, Gerardo Fontalvo, Christian Mitterer, Jozef Keckes

Lehrstuhl für Materialphysik (430)

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

16 Zitate (Scopus)

Titel in Übersetzung	Rapid determination of stress factors and absolute residual stresses in thin films
Originalsprache	Englisch
Seiten (von - bis)	777-783
Fachzeitschrift	Journal of applied crystallography
Jahrgang	39
DOIs	https://doi.org/10.1107/S002188980603322X
Publikationsstatus	Veröffentlicht - 2006

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10.1107/S002188980603322X

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doi = "10.1107/S002188980603322X",

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T1 - Rapid determination of stress factors and absolute residual stresses in thin films

AU - Martinschitz, K.J.

AU - Eiper, E.

AU - Massl, S.

AU - Köstenbauer, Harald

AU - Daniel, Rostislav

AU - Fontalvo, Gerardo

AU - Mitterer, Christian

AU - Keckes, Jozef

PY - 2006

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DO - 10.1107/S002188980603322X

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VL - 39

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JO - Journal of applied crystallography

JF - Journal of applied crystallography

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