Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing

Matt B. Lowry; Daniel Kiener; B. B. Le Blanc; Claire Chisholm; Jeff N. Florando; J. W. Jr Morris; Andrew M. Minor

doi:10.1017/S1431927610061957

Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing

Titel in Übersetzung: Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing

Matt B. Lowry, Daniel Kiener, B. B. Le Blanc, Claire Chisholm, Jeff N. Florando, J. W. Jr Morris, Andrew M. Minor

Lehrstuhl für Materialphysik (430)

Publikation: Beitrag in Fachzeitschrift › Artikel › Forschung › Begutachtung

Titel in Übersetzung	Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing
Originalsprache	Englisch
Seiten (von - bis)	1748-1749
Fachzeitschrift	Microscopy and microanalysis
Jahrgang	16
DOIs	https://doi.org/10.1017/S1431927610061957
Publikationsstatus	Veröffentlicht - 2010

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10.1017/S1431927610061957

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title = "Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing",

author = "Lowry, {Matt B.} and Daniel Kiener and {Le Blanc}, {B. B.} and Claire Chisholm and Florando, {Jeff N.} and Morris, {J. W. Jr} and Minor, {Andrew M.}",

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doi = "10.1017/S1431927610061957",

language = "English",

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journal = "Microscopy and microanalysis",

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T1 - Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing

AU - Lowry, Matt B.

AU - Kiener, Daniel

AU - Le Blanc, B. B.

AU - Chisholm, Claire

AU - Florando, Jeff N.

AU - Morris, J. W. Jr

AU - Minor, Andrew M.

PY - 2010

Y1 - 2010

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DO - 10.1017/S1431927610061957

M3 - Article

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VL - 16

SP - 1748

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JO - Microscopy and microanalysis

JF - Microscopy and microanalysis

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