Local Characterization Tools as the Key for Optimized Performance of Hard Coatings: Towards a comprehensive understanding of microstructure-property-performance relations of hard coatings and thin films

Christian Mitterer

Local Characterization Tools as the Key for Optimized Performance of Hard Coatings: Towards a comprehensive understanding of microstructure-property-performance relations of hard coatings and thin films

Publikation: Konferenzbeitrag › Vortrag › Forschung

Originalsprache	Englisch
Publikationsstatus	Veröffentlicht - 2016
Veranstaltung	AVS 63rd International Symposium & Exhibition - Nashville, USA / Vereinigte Staaten Dauer: 6 Nov. 2016 → 11 Nov. 2016

Konferenz

Konferenz	AVS 63rd International Symposium & Exhibition
Land/Gebiet	USA / Vereinigte Staaten
Ort	Nashville
Zeitraum	6/11/16 → 11/11/16

AVS 63rd International Symposium & Exhibition
Christian Mitterer (Redner/-in)
6 Nov. 2016 → 11 Nov. 2016
Aktivität: Teilnahme an oder Organisation einer Veranstaltung › Konferenzteilnahme

Dieses zitieren

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title = "Local Characterization Tools as the Key for Optimized Performance of Hard Coatings: Towards a comprehensive understanding of microstructure-property-performance relations of hard coatings and thin films",

author = "Christian Mitterer",

year = "2016",

language = "English",

note = "AVS 63rd International Symposium & Exhibition ; Conference date: 06-11-2016 Through 11-11-2016",

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Local Characterization Tools as the Key for Optimized Performance of Hard Coatings: Towards a comprehensive understanding of microstructure-property-performance relations of hard coatings and thin films. / Mitterer, Christian.
2016. AVS 63rd International Symposium & Exhibition, Nashville, USA / Vereinigte Staaten.

Publikation: Konferenzbeitrag › Vortrag › Forschung

Local Characterization Tools as the Key for Optimized Performance of Hard Coatings: Towards a comprehensive understanding of microstructure-property-performance relations of hard coatings and thin films

Konferenz

Aktivitäten

AVS 63rd International Symposium & Exhibition

Dieses zitieren